ISTFA 2010

ISTFA 2010

Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA

eBook - 2010
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This collection from the November 2010 conference shares recent research results on the detection and elimination of microelectronic device failures. The 72 papers and 11 posters address package level analysis, photon-based techniques, sample preparation, nanoscale electronic characterization, circuit edit, and MEMS devices. The recipient of the best paper award isolates a temperature-sensitive failure in mixed-signal circuitry by combining high-resolution pulsed TIVA with a solid immersion lens. Four papers on alternative energy discuss techniques for characterizing defects in solar silicon and evaluating the quality of solar cell modules. No subject index is provided in the book, but the CD-ROM contains searchable electronic versions of the papers in Adobe Acrobat format. Annotation ©2011 Book News, Inc., Portland, OR (booknews.com)

Publisher: Materials Park, Ohio :, ASM International,, 2010
ISBN: 9781680155105
1680155105
9781615037278
1615037276
9781615030415
9780615030418
Characteristics: 1 online resource (xix, 464 pages) : color illustrations

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